Investigation of PTFE transfer films by infrared emission spectroscopy and phase-locked ellipsometry

by James L. Lauer

Publisher: National Aeronautics and Space Administration, Publisher: For sale by the National Technical Information Service in [Washington, D.C.], [Springfield, Va

Written in English
Published: Downloads: 666
Share This

Subjects:

  • Infrared spectroscopy.

Edition Notes

StatementJames L. Lauer and Bruce G. Bunting and William R. Jones, Jr.
SeriesNASA technical memorandum -- 89844.
ContributionsBunting, Bruce G., Jones, William R., 1940-, United States. National Aeronautics and Space Administration.
The Physical Object
FormatMicroform
Pagination1 v.
ID Numbers
Open LibraryOL15282040M

Investigation of PTFE transfer films by infrared emission spectroscopy and phase-locked ellipsometry by James L. Lauer Download PDF EPUB FB2